Geometric optimization of high performance interconnect of Rigid/Flexible/Rigid substrate for Wafer Level Packaging in Solid State Lighting applications by numerical simulations

P. Liu, J. Zhang, R. Sokolovskij, H. V. van Zeijl, B. Mimoun, G. Zhang
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引用次数: 1

Abstract

Wafer Level Packaging (WLP) technology for Solid State Lighting application is regarded as great potential for cost reduction. Rigid/Flexible/Rigid (RFR) substrate that is capable of transforming WLP devices from 2-dimentional into 3-dimentional devices is of enormous interest in SSL industry. In this work, numerical simulations were performed to discover the optimized geometry of interconnects in the newly developed RFR substrate to meet the harsh requirements set for SSL products. The relations of maximum temperatures in the substrate as a function of interconnect geometry and bending angle at different current levels were derived. Moreover, by using the derived relations, geometric effects on electromigration behaviours of interconnect were investigated. Suggestions were given for optimizing the geometry of interconnects and avoiding over-bending of the substrate.
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基于数值模拟的固态照明晶圆级封装中刚性/柔性/刚性基板的高性能互连几何优化
晶圆级封装(WLP)技术被认为是降低固态照明成本的巨大潜力。刚性/柔性/刚性(RFR)基板能够将WLP器件从二维转换为三维器件,这在SSL行业引起了极大的兴趣。在这项工作中,进行了数值模拟,以发现新开发的RFR衬底中互连的优化几何形状,以满足SSL产品的苛刻要求。推导了不同电流水平下衬底内最高温度与互连几何形状和弯曲角度的关系。此外,利用推导出的关系,研究了几何效应对互连体电迁移行为的影响。提出了优化互连几何结构和避免衬底过度弯曲的建议。
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