A composite high-voltage device using low-voltage SOI MOSFETs

S. Valeri, A. L. Robinson
{"title":"A composite high-voltage device using low-voltage SOI MOSFETs","authors":"S. Valeri, A. L. Robinson","doi":"10.1109/SOSSOI.1990.145766","DOIUrl":null,"url":null,"abstract":"A circuit is described that uses low-voltage transistors to form a high-voltage composite device. The circuit is a series string of SOI (silicon-on-insulator) MOSFETs and associated biasing elements fabricated using a modified nMOS process on a SIMOX (separation by implantation of oxygen) substrate. The circuit voltages higher than the breakdown voltage of a single transistor by dividing the applied voltage among the transistors in the string. MOSFET-like characteristics with breakdown voltage up to 60 V are demonstrated using a string of 25 SOI MOSFETs, each with a breakdown voltage of 6-7 V.<<ETX>>","PeriodicalId":344373,"journal":{"name":"1990 IEEE SOS/SOI Technology Conference. Proceedings","volume":"65 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1990 IEEE SOS/SOI Technology Conference. Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SOSSOI.1990.145766","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

A circuit is described that uses low-voltage transistors to form a high-voltage composite device. The circuit is a series string of SOI (silicon-on-insulator) MOSFETs and associated biasing elements fabricated using a modified nMOS process on a SIMOX (separation by implantation of oxygen) substrate. The circuit voltages higher than the breakdown voltage of a single transistor by dividing the applied voltage among the transistors in the string. MOSFET-like characteristics with breakdown voltage up to 60 V are demonstrated using a string of 25 SOI MOSFETs, each with a breakdown voltage of 6-7 V.<>
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一种使用低压SOI mosfet的复合高压器件
本文描述了一种用低压晶体管构成高压复合器件的电路。该电路由一系列SOI(绝缘体上硅)mosfet和相关的偏置元件组成,采用改良的nMOS工艺在SIMOX(氧注入分离)衬底上制造。电路电压高于单个晶体管的击穿电压,通过在串中的晶体管之间除以施加电压。使用一串25个SOI mosfet(每个击穿电压为6-7 V)来演示击穿电压高达60 V的类mosfet特性。
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The influence of emitter efficiency on single transistor latch in silicon-on-insulator MOSFETs Low-field charge injection in SIMOX buried oxides The effect of high field stress on the capacitance/voltage characteristics of buried insulators formed by oxygen implantation Polysilicon thin film transistors with field-plate-induced drain junction for both high-voltage and low-voltage applications Persistent photoconductivity in SIMOX films
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