{"title":"Fault-tolerant design of VLSI circuits and systems","authors":"P.V.C.V. Reddy","doi":"10.1109/ASIC.1990.186075","DOIUrl":null,"url":null,"abstract":"The ever-increasing complexity of very large scale integration (VLSI) has a considerable impact on the design and implementation of fault-tolerant circuits and systems. The techniques of fault-tolerance are well established. VLSI, however, introduces problems in fault-tolerant design. An overview of the design and implementation of fault-tolerant systems in a VLSI environment is presented.<<ETX>>","PeriodicalId":126693,"journal":{"name":"Third Annual IEEE Proceedings on ASIC Seminar and Exhibit","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Third Annual IEEE Proceedings on ASIC Seminar and Exhibit","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASIC.1990.186075","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The ever-increasing complexity of very large scale integration (VLSI) has a considerable impact on the design and implementation of fault-tolerant circuits and systems. The techniques of fault-tolerance are well established. VLSI, however, introduces problems in fault-tolerant design. An overview of the design and implementation of fault-tolerant systems in a VLSI environment is presented.<>
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