On-line test of embedded systems: Which role for functional test?

Abstract

On-line test of embedded systems is becoming increasingly important mainly due to the growing usage of electronic systems in safety-critical applications and to the higher chances of failures in new devices. Standards and regulations are also pushing the adoption of effective on-line test solutions both at the device and at the system level. While Design for On-Line Testability is definitely an effective solution, there are situations in which alternative or complementary ways have to be explored, and functional testing stands as the only viable solution. The presentation will overview the main open issues in this area (e.g., in terms of achievable defect coverage, test time, and costs), emphasizing the limitations of the functional approach, but also reporting about recent advancements that could allow its easier and wider adoption in practice.