{"title":"Detection & diagnostics in today's advanced technology nodes","authors":"Y. Zorian","doi":"10.1109/DDECS.2014.6868751","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":114139,"journal":{"name":"IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2014.6868751","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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