Boundary-scan, a cradle-to-grave test, programming and maintenance solution that stands the test of time

Abstract

Since ratification by the IEEE in 1990, the 1149.1 standard, synonymous with boundary-scan and JTAG, has been relied upon heavily to address limited physical test access challenges in complex and highly dense electronic designs in industries ranging from, but not limited to, Industrial, Tele/DataComm, Automotive and Mil/Aero. Over the years the advancement of boundary-scan software and hardware and the evolution of JTAG-based standards have facilitated a vast range of test and in-system programming capabilities for use in prototype verification test, manufacturing/production test, system test and even test of systems in the field. This paper will examine the use of JTAG/boundary-scan throughout the lifecycle of a system from conception to end-of-life support, touching on topics such as Design-For-Test techniques for board-level and system-level test, integration of boundary-scan with existing ATE, with an emphasis on Intermediate-level and Depot-level test as well as a novel approach to perform remote boundary-scan test, diagnostics and reconfiguration.