Constantin Florin Comanescu, A. Istrate, L. Veca, F. Năstase, R. Gavrila, M. Purica
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引用次数: 4
Abstract
A comparative study regarding single layer graphene (GR) transfer from copper to oxidized silicon substrate using Soak and Peel delamination, Contact printing, Electrochemical delamination is presented. Structural modifications of GR were determined by Raman spectroscopy, while optical and atomic force microscopy emphases the size and area of the transferred GR films.
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