{"title":"Proposal of a new array structure to enable the detection of soft failure and the aging test with overcurrent of resistive element","authors":"Shingo Sato, Y. Omura","doi":"10.1109/ICMTS.2016.7476173","DOIUrl":null,"url":null,"abstract":"A new array structure to detect the soft failure of resistive elements is reported. By adding terminals to sense local potentials and high pass filtering a bit map image, it becomes possible to detect soft failure. Thanks to a simplified peripheral circuit, the layout area is drastically reduced and an aging test with overcurrent becomes possible.","PeriodicalId":344487,"journal":{"name":"2016 International Conference on Microelectronic Test Structures (ICMTS)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 International Conference on Microelectronic Test Structures (ICMTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMTS.2016.7476173","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
A new array structure to detect the soft failure of resistive elements is reported. By adding terminals to sense local potentials and high pass filtering a bit map image, it becomes possible to detect soft failure. Thanks to a simplified peripheral circuit, the layout area is drastically reduced and an aging test with overcurrent becomes possible.
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