S. Danzeca, P. Peronnard, G. Foucard, G. Tsiligiannis, R. Secondo, R. Ferraro, C. McAllister, T. Borel, M. Brugger, A. Masi, S. Gilardoni
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引用次数: 0
Abstract
Vulnerability of a variety of components for particle accelerators electronics to single event effects, total ionizing dose and displacement damage has been analyzed. The tested parts include analog, linear, digital, and hybrid devices.
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