{"title":"Latency insertion method (LIM) for CMOS circuit simulations with multi-rate considerations","authors":"P. Goh, J. Schutt-Ainé","doi":"10.1109/EPEPS.2011.6100205","DOIUrl":null,"url":null,"abstract":"In this paper, we present an application of the latency insertion method (LIM) to the transient simulations of CMOS circuits and compare it to traditional SPICE based methods. In addition, we extend the multi-rate simulation technique and apply it to the simulation of CMOS circuits in the LIM environment and illustrate its computational efficiently over the basic LIM.","PeriodicalId":313560,"journal":{"name":"2011 IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2011.6100205","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11
Abstract
In this paper, we present an application of the latency insertion method (LIM) to the transient simulations of CMOS circuits and compare it to traditional SPICE based methods. In addition, we extend the multi-rate simulation technique and apply it to the simulation of CMOS circuits in the LIM environment and illustrate its computational efficiently over the basic LIM.