{"title":"A design-in methodology to ensure first time success of complex digital signal processors","authors":"A. Gautam, J. Rao, R. Rathi, H. Udayakumar","doi":"10.1109/ICVD.1999.745180","DOIUrl":null,"url":null,"abstract":"TMS320C2700 is the first TI DSP with a new architecture combining the features of a traditional DSP and Micro-Controller, targeted for Hard Disk Drives, DVD and Embedded Control applications. The development of this reusable DSP Core and the Emulation Test Chip with an aim of fast turn-around to market posed many design and methodology challenges. These challenges included efficient layout of a datapath and bus-dominant Core, meeting all the performance and reliability requirements, clocking methodology for a reusable Core, and the design of a 1 million gate Emulation Chip with 82 K/spl times/16 on-chip RAM and many peripherals. This paper describes the various design-in approaches used to meet these goals, reducing the iterations in the design cycle, ultimately resulting in a first pass working silicon for the design.","PeriodicalId":443373,"journal":{"name":"Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-01-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICVD.1999.745180","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
TMS320C2700 is the first TI DSP with a new architecture combining the features of a traditional DSP and Micro-Controller, targeted for Hard Disk Drives, DVD and Embedded Control applications. The development of this reusable DSP Core and the Emulation Test Chip with an aim of fast turn-around to market posed many design and methodology challenges. These challenges included efficient layout of a datapath and bus-dominant Core, meeting all the performance and reliability requirements, clocking methodology for a reusable Core, and the design of a 1 million gate Emulation Chip with 82 K/spl times/16 on-chip RAM and many peripherals. This paper describes the various design-in approaches used to meet these goals, reducing the iterations in the design cycle, ultimately resulting in a first pass working silicon for the design.