An ILP Based ATPG Technique for Multiple Aggressor Crosstalk Faults Considering the Effects of Gate Delays

Kunal P. Ganeshpure, S. Kundu
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引用次数: 3

Abstract

Crosstalk faults have emerged as a significant mechanism for circuit failure. Long signal nets are of particular concern because they tend to have a higher coupling capacitance to overall capacitance ratio. A typical long net also has multiple aggressors. In generating patterns to create maximal crosstalk noise on a net, it may not be possible to activate all aggressors logically or simultaneously. Therefore, pattern generation must focus on activating a maximal subset of aggressors switching on or about the same time the victim net switches, while propagating the fault effect to a primary output. This is a well-known problem. In this paper, we present a solution which uses 0-1 Integer Linear Programming (ILP) in conjunction with circuit transformation to model gate delays. A major contribution of this paper is modeling multi-path fault propagation as a linear programming problem. The proposed technique was applied to ISCAS 85 benchmark circuits. Results indicate that percentage of total capacitance that can be switched varies from 20-80%. Patterns generated by this technique are useful for both manufacturing test application as well as signal integrity verification.
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考虑门延迟影响的多攻击者串扰故障的基于ILP的ATPG技术
串扰故障已成为电路故障的重要机制。长信号网特别值得关注,因为它们往往具有较高的耦合电容与总电容比。一个典型的长网也有多个攻击者。在生成模式以在网络上产生最大的串扰噪声时,可能无法逻辑地或同时激活所有攻击者。因此,模式生成必须专注于激活攻击者的最大子集,或者大约在受害者网络切换的同时激活攻击者,同时将故障效应传播到主要输出。这是一个众所周知的问题。在本文中,我们提出了一种使用0-1整数线性规划(ILP)结合电路变换来模拟门延迟的解决方案。本文的一个主要贡献是将多路径故障传播建模为线性规划问题。该技术已应用于iscas85基准电路。结果表明,可以切换的总电容百分比在20-80%之间。该技术生成的模式对制造测试应用和信号完整性验证都很有用。
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