{"title":"Innovative practices session 5C: Advancements in test -keeping moore moving!","authors":"M. E. Amyeen","doi":"10.1109/VTS.2015.7116272","DOIUrl":null,"url":null,"abstract":"This talk focuses on test and debug challenges that are unique to large die products. A technical review of problems being faced today specific to test quality, test time, test cost, electrical and speed content, and debug will be outlined along with some current solutions being pursued to drive large die products to production quality. The talk concludes with a discussion about new solutions and areas of innovation that will be necessary to keep future generations of these products manufacturable, and on a cadence that meets the stringent time to market requirements.","PeriodicalId":187545,"journal":{"name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 33rd VLSI Test Symposium (VTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS.2015.7116272","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
This talk focuses on test and debug challenges that are unique to large die products. A technical review of problems being faced today specific to test quality, test time, test cost, electrical and speed content, and debug will be outlined along with some current solutions being pursued to drive large die products to production quality. The talk concludes with a discussion about new solutions and areas of innovation that will be necessary to keep future generations of these products manufacturable, and on a cadence that meets the stringent time to market requirements.
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