IC layout and manufacturability: critical links and design flow implications

A. Kahng
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引用次数: 5

Abstract

We assess the prospects for new tools and flows in the interface between layout design and manufacturability. We begin with a review of classic elements of this interface, then focus on more recently critical issues: (i) layout design for reduced CMP variability; (ii) layout design for PSM; and (iii) layout design for OPC. Our discussion highlights the many ways in which layout affords effective means of optimizing manufacturability, as well as opportunities for research and development.
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集成电路布局和可制造性:关键环节和设计流程的影响
我们评估了在布局设计和可制造性之间的界面中新工具和流程的前景。我们首先回顾这个界面的经典元素,然后关注最近的关键问题:(i)减少CMP可变性的布局设计;(ii) PSM的布局设计;(iii) OPC的布局设计。我们的讨论强调了布局提供优化可制造性的有效手段的许多方法,以及研究和开发的机会。
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