Hao Qiu, K. Takeuchi, T. Mizutani, T. Saraya, M. Kobayashi, T. Hiramoto
{"title":"A new write stability metric using extended write butterfly curve for yield estimation in SRAM cells at low supply voltage","authors":"Hao Qiu, K. Takeuchi, T. Mizutani, T. Saraya, M. Kobayashi, T. Hiramoto","doi":"10.1109/ICMTS.2016.7476190","DOIUrl":null,"url":null,"abstract":"A new extended write butterfly curve (BC) is proposed and evaluated through our device-matrix-array test-element-group (DMA-TEG) fabricated by Silicon-on-Thin-BOX (SOTB) technology. A good normality at low supply voltage (VDD), as well as good correlation with word-line method, demonstrates the extended write BC as a good candidate for yield estimation at low VDD. The comparison with conventional write BC is also discussed.","PeriodicalId":344487,"journal":{"name":"2016 International Conference on Microelectronic Test Structures (ICMTS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 International Conference on Microelectronic Test Structures (ICMTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMTS.2016.7476190","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
A new extended write butterfly curve (BC) is proposed and evaluated through our device-matrix-array test-element-group (DMA-TEG) fabricated by Silicon-on-Thin-BOX (SOTB) technology. A good normality at low supply voltage (VDD), as well as good correlation with word-line method, demonstrates the extended write BC as a good candidate for yield estimation at low VDD. The comparison with conventional write BC is also discussed.
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