Next-Generation Design and Technology Co-optimization (DTCO) of System on Integrated Chip (SoIC) for Mobile and HPC Applications

Y. Cheng, F. Lee, M.F. Chen, J. Yuan, Tze-Chiang Huang, K.-J. Chen, C. Wang, C.-L. Chen, C. Tsai, Douglas C. H. Yu
{"title":"Next-Generation Design and Technology Co-optimization (DTCO) of System on Integrated Chip (SoIC) for Mobile and HPC Applications","authors":"Y. Cheng, F. Lee, M.F. Chen, J. Yuan, Tze-Chiang Huang, K.-J. Chen, C. Wang, C.-L. Chen, C. Tsai, Douglas C. H. Yu","doi":"10.1109/IEDM13553.2020.9372005","DOIUrl":null,"url":null,"abstract":"This paper demonstrates the next-generation design and technology co-optimization (DTCO) of system on integrated chip (SoIC) for mobile and HPC applications, where the SoIC technology was proposed to integrate multichips with different functionality and technology into a single SoC chip. The new DTCO includes overall die partitioning, die integration, and interconnect. These methodologies can be used for improving time-to-market and trade-off between performance and cost. In this paper, two prototypes of stacking CPU and memory dies are demonstrated with 15% performance gain and 30% average point-to-point distance reduction.","PeriodicalId":415186,"journal":{"name":"2020 IEEE International Electron Devices Meeting (IEDM)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE International Electron Devices Meeting (IEDM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM13553.2020.9372005","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

Abstract

This paper demonstrates the next-generation design and technology co-optimization (DTCO) of system on integrated chip (SoIC) for mobile and HPC applications, where the SoIC technology was proposed to integrate multichips with different functionality and technology into a single SoC chip. The new DTCO includes overall die partitioning, die integration, and interconnect. These methodologies can be used for improving time-to-market and trade-off between performance and cost. In this paper, two prototypes of stacking CPU and memory dies are demonstrated with 15% performance gain and 30% average point-to-point distance reduction.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
面向移动和高性能计算应用的系统集成芯片(SoIC)的下一代设计和技术协同优化(DTCO)
本文展示了用于移动和高性能计算应用的系统集成芯片(SoIC)的下一代设计和技术协同优化(DTCO),其中SoIC技术被提出将具有不同功能和技术的多芯片集成到单个SoC芯片中。新的DTCO包括整体芯片划分、芯片集成和互连。这些方法可用于缩短上市时间,并在性能和成本之间进行权衡。本文演示了两种堆叠CPU和内存芯片的原型,性能提高了15%,平均点对点距离减少了30%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Subband Engineering by Combination of Channel Thickness Scaling and (111) Surface Orientation in InAs-On-Insulator nMOSFETs A Reliability Enhanced 5nm CMOS Technology Featuring 5th Generation FinFET with Fully-Developed EUV and High Mobility Channel for Mobile SoC and High Performance Computing Application Scaling MoS2 NCFET to 83 nm with Record-low Ratio of SSave/SSRef.=0.177 and Minimum 20 mV Hysteresis Future Logic Scaling: Towards Atomic Channels and Deconstructed Chips An Improved Model on Buried-Oxide Damage for Total-Ionizing-Dose Effect on HV SOI LDMOS
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1