T. Martín-Guerrero, J. T. Entrambasaguas, C. Camacho-Peñalosa
{"title":"Poly-harmonic distortion model extraction in charge-controlled one-port devices","authors":"T. Martín-Guerrero, J. T. Entrambasaguas, C. Camacho-Peñalosa","doi":"10.23919/EUMIC.2017.8230707","DOIUrl":null,"url":null,"abstract":"A charge-controlled, one-port device is used to describe and discuss the extraction procedure of a Poly-Harmonic Distortion (PHD) model in detail. For this case, both voltage and current waveforms are shown to be enough to fully characterize the PHD model. It is also shown that all the information specifically required for this PHD model definition can be stored in the Fourier coefficients of the incremental conductance and capacitance. The results are validated by comparing them with those obtained using a commercial circuit simulation tool.","PeriodicalId":120932,"journal":{"name":"2017 12th European Microwave Integrated Circuits Conference (EuMIC)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 12th European Microwave Integrated Circuits Conference (EuMIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/EUMIC.2017.8230707","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
A charge-controlled, one-port device is used to describe and discuss the extraction procedure of a Poly-Harmonic Distortion (PHD) model in detail. For this case, both voltage and current waveforms are shown to be enough to fully characterize the PHD model. It is also shown that all the information specifically required for this PHD model definition can be stored in the Fourier coefficients of the incremental conductance and capacitance. The results are validated by comparing them with those obtained using a commercial circuit simulation tool.