{"title":"A fault primitive based analysis of linked faults in RAMs","authors":"Z. Al-Ars, S. Hamdioui, A. V. Goor","doi":"10.1109/MTDT.2003.1222358","DOIUrl":null,"url":null,"abstract":"Linked faults are very important for memory testing because they reduce the fault coverage of the tests. Their analysis has proven to be a source for new memory tests, characterized by an increased fault coverage for a given test time. This paper presents an analysis of linked faults, based on the concept of fault primitives, such that the whole space of linked faults is investigated, accounted for and validated. The paper also introduces a systematic way to develop tests for such faults.","PeriodicalId":412381,"journal":{"name":"Records of the 2003 International Workshop on Memory Technology, Design and Testing","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Records of the 2003 International Workshop on Memory Technology, Design and Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MTDT.2003.1222358","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
Abstract
Linked faults are very important for memory testing because they reduce the fault coverage of the tests. Their analysis has proven to be a source for new memory tests, characterized by an increased fault coverage for a given test time. This paper presents an analysis of linked faults, based on the concept of fault primitives, such that the whole space of linked faults is investigated, accounted for and validated. The paper also introduces a systematic way to develop tests for such faults.
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