D. S. Lee, A. Steckl, U. Hommerich, E. Nyein, P. Rack, James M. Fitz-Gerald, J. Zavada
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引用次数: 3
Abstract
In this paper, we report on the growth of in-situ Tm-doped Al/sub x/Ga/sub 1-x/N films and the corresponding effect of Al composition on the EL emission. PL and CL show almost same trend as EL with various Al compositions. The 465-nm emission is barely present at x=0.16, it becomes very clear for x/spl ges/0.39, and it dominates for x/spl ges/0.81. The EL emission at 802 nm experienced the opposite trend, decreasing with Al composition. We have confirmed that blue EL emission becomes dominant over IR emission with increasing Al composition in the Al/sub x/Ga/sub 1-x/N host.
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