Effects of stacking sequence of electrodeposited Sn and Bi layers on reflowed Sn-Bi solder alloys

Seen Fang Lee, Yingxin Goh, A. Haseeb
{"title":"Effects of stacking sequence of electrodeposited Sn and Bi layers on reflowed Sn-Bi solder alloys","authors":"Seen Fang Lee, Yingxin Goh, A. Haseeb","doi":"10.1109/IEMT.2012.6521792","DOIUrl":null,"url":null,"abstract":"Eutectic Sn-Bi alloy is gaining considerable attention in the electronic packaging applications. This alloy exhibits favorable properties such as low melting temperature, good wettability, high yield strength and fracture strength at room temperature. Miniaturization of electronic devices limited the choices of deposition technique where electrodeposition is identified as one of the most suitable ones. This work focuses on the formation of eutectic Sn-Bi solder alloys by reflowing a metal stack containing sequentially electrodeposited Sn and Bi layers. Three layer sequential deposition of Sn-Bi alloys is a new attempt in the electroplating field. The effects of layer sequence on the composition and microstructure of the resulting alloy is investigated. Irrespective of the layering sequence, a homogeneous microstructure is achieved after reflow. Near-eutectic alloy of composition Sn- 54.6 wt.% Bi is obtained from this sequential plating method.","PeriodicalId":315408,"journal":{"name":"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.2012.6521792","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

Eutectic Sn-Bi alloy is gaining considerable attention in the electronic packaging applications. This alloy exhibits favorable properties such as low melting temperature, good wettability, high yield strength and fracture strength at room temperature. Miniaturization of electronic devices limited the choices of deposition technique where electrodeposition is identified as one of the most suitable ones. This work focuses on the formation of eutectic Sn-Bi solder alloys by reflowing a metal stack containing sequentially electrodeposited Sn and Bi layers. Three layer sequential deposition of Sn-Bi alloys is a new attempt in the electroplating field. The effects of layer sequence on the composition and microstructure of the resulting alloy is investigated. Irrespective of the layering sequence, a homogeneous microstructure is achieved after reflow. Near-eutectic alloy of composition Sn- 54.6 wt.% Bi is obtained from this sequential plating method.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
电沉积锡、铋层叠加顺序对回流锡铋钎料合金的影响
共晶锡铋合金在电子封装领域的应用日益受到重视。该合金具有熔点低、润湿性好、室温屈服强度和断裂强度高等优良性能。电子器件的小型化限制了沉积技术的选择,其中电沉积被认为是最合适的沉积技术之一。这项工作的重点是形成共晶锡铋焊料合金通过回流的金属堆栈包含顺序电沉积锡和铋层。三层连续沉积锡铋合金是电镀领域的一种新尝试。研究了层序对合金成分和组织的影响。无论分层顺序如何,回流后均可获得均匀的微观结构。用这种顺序镀法制备了成分为Sn- 54.6% wt.% Bi的近共晶合金。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Interfacial reactions between Sn-3.8 Ag-0.7Cu solder and Ni-W alloy films Removal of flux residues from highly dense assemblies On the drop impact performance of IPDTM devices with different process technologies Pad bending improvement on copper wire bonding on NiP/Pd/Au bond pad Mold compound selection study for CMOS90 176 lead LQFP 24×24mm package
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1