F. Dubecký, J. Darmo, M. Krempaský, J. Betkó, I. Bešše, M. Pikna, A. Šatka, J. Oswald, P. Pelfer
{"title":"On relation between detection parameters of SI GaAs particle detectors and physical properties of starting materials","authors":"F. Dubecký, J. Darmo, M. Krempaský, J. Betkó, I. Bešše, M. Pikna, A. Šatka, J. Oswald, P. Pelfer","doi":"10.1109/SIM.1996.570881","DOIUrl":null,"url":null,"abstract":"The role of deep levels and material inhomogeneities is studied in regard to their influence on the parameters of Cr-doped and undoped bulk semi-insulating GaAsb-based particle detectors. It is shown that the charge collection efficiency and the energy resolution of detectors is strongly affected by physical properties of starting material.","PeriodicalId":391894,"journal":{"name":"Proceedings of Semiconducting and Semi-Insulating Materials Conference","volume":"77 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-04-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Semiconducting and Semi-Insulating Materials Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SIM.1996.570881","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The role of deep levels and material inhomogeneities is studied in regard to their influence on the parameters of Cr-doped and undoped bulk semi-insulating GaAsb-based particle detectors. It is shown that the charge collection efficiency and the energy resolution of detectors is strongly affected by physical properties of starting material.
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