Single-Event-Transient tolerant comparators with auto-zeroing techniques

Abstract

Radiation-hardened-by-design comparators to mitigate Single-Event-Transients (SETs) are presented. Folded cascode comparators are designed using three types of auto-zeroing techniques: input offset storage (IOS), output offset storage (OOS), and auxiliary offset storage (AOS). The designs are implemented using CMOS 90 nm, and analyzed using Spectre from Cadence. Simulation results show that the transient effect at the output of the comparator with auto-zeroing techniques is shorter than the transcient cancellation operation time while it can be a significant error at the output in a general folded cascode comparator.