A cavity channel SESO embedded memory with low standby-power techniques

B. Atwood, T. Ishii, Takao Watanabe, T. Mine, N. Kameshiro, T. Sano, K. Yano
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引用次数: 1

Abstract

A 22F/sup 2/ 3-transistor dynamic memory cell, based on a newly fabricated cavity channel SESO (single-electron shutoff) transistor is proposed for low-power mobile SOCs. The ultra-low leakage SESO device is formed above the bulk devices to yield the small cell size. With low-power techniques, this memory can achieve nearly an order of magnitude lower standby power than conventional memory. A 1 Mbyte SESO embedded memory core is estimated to have a standby power consumption of 24.2 /spl mu/A in a 90 nm process.
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一种具有低待机功耗技术的腔通道SESO嵌入式存储器
提出了一种22F/sup 2/ 3晶体管动态存储单元,该存储单元基于一种新型腔通道单电子关断(SESO)晶体管。超低泄漏SESO器件形成在本体器件之上,以产生较小的电池尺寸。通过低功耗技术,这种存储器可以实现比传统存储器低一个数量级的待机功耗。据估计,在90nm工艺中,1mbyte SESO嵌入式存储核心的待机功耗为24.2 /spl mu/A。
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