{"title":"Measurement system capability analysis","authors":"R. Potter","doi":"10.1109/ASMC.1990.111235","DOIUrl":null,"url":null,"abstract":"A procedure for carrying out a measurement system capability study is presented. The tool is first calibrated against a known standard. Then, the tool's short-term repeatability is determined. A reproducibility evaluation is performed, stability is evaluated over time, and statistical process control is implemented. Key terminology in measurement capability studies is reviewed. Example formulas for a variance components analysis in the simple case where operators are the only source of variation are given.<<ETX>>","PeriodicalId":158760,"journal":{"name":"IEEE/SEMI Conference on Advanced Semiconductor Manufacturing Workshop","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE/SEMI Conference on Advanced Semiconductor Manufacturing Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASMC.1990.111235","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
A procedure for carrying out a measurement system capability study is presented. The tool is first calibrated against a known standard. Then, the tool's short-term repeatability is determined. A reproducibility evaluation is performed, stability is evaluated over time, and statistical process control is implemented. Key terminology in measurement capability studies is reviewed. Example formulas for a variance components analysis in the simple case where operators are the only source of variation are given.<>
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