{"title":"Metrics evaluation of software reliability growth models","authors":"Francis C. L. Chan, P. Dasiewicz, R. Seviora","doi":"10.1109/ISSRE.1991.145373","DOIUrl":null,"url":null,"abstract":"Numerous software reliability growth models have been proposed. The authors present three metrics which have been helpful in assessing the applicability and predictive validity of these models. These metrics are the relative fitting error metric, the short term predictive validity metric and the long term predictive validity metric. The application of these three metrics is illustrated on estimation of field reliability of telecommunication switching systems.<<ETX>>","PeriodicalId":338844,"journal":{"name":"Proceedings. 1991 International Symposium on Software Reliability Engineering","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-05-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 1991 International Symposium on Software Reliability Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSRE.1991.145373","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
Numerous software reliability growth models have been proposed. The authors present three metrics which have been helpful in assessing the applicability and predictive validity of these models. These metrics are the relative fitting error metric, the short term predictive validity metric and the long term predictive validity metric. The application of these three metrics is illustrated on estimation of field reliability of telecommunication switching systems.<>
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