S. Onoda, T. Hirao, J. S. Laird, T. Wakasa, T. Yamakawa, T. Okamoto, Y. Koizumi, T. Kamiya
{"title":"Development of monte carlo modeling for proton induced charge in si pin photodiode","authors":"S. Onoda, T. Hirao, J. S. Laird, T. Wakasa, T. Yamakawa, T. Okamoto, Y. Koizumi, T. Kamiya","doi":"10.1109/TNS.2004.835110","DOIUrl":null,"url":null,"abstract":"High-energy protons induce Single Event Transient (SET) currents that trigger bit errors in optical data links used in radiation environments. Here, Monte Carlo modeling and the Evaluated Nuclear Data Format (ENDF) database library were combined to develop an approach for estimating proton induced SET currents in photodiodes. Modeling of the SET current distribution induced in a Si pin photodiode is compared to charge collection data measured in the laboratory. In this paper, we discuss the basic methodology of the approach and comment on any differences noted between theory and experiment.","PeriodicalId":329028,"journal":{"name":"Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TNS.2004.835110","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
High-energy protons induce Single Event Transient (SET) currents that trigger bit errors in optical data links used in radiation environments. Here, Monte Carlo modeling and the Evaluated Nuclear Data Format (ENDF) database library were combined to develop an approach for estimating proton induced SET currents in photodiodes. Modeling of the SET current distribution induced in a Si pin photodiode is compared to charge collection data measured in the laboratory. In this paper, we discuss the basic methodology of the approach and comment on any differences noted between theory and experiment.
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