A. Schulze, P. Eyben, J. Mody, K. Paredis, L. Wouters, U. Celano, W. Vandervorst
{"title":"Mapping Conductance and Carrier Distributions in Confined Three-Dimensional Transistor Structures","authors":"A. Schulze, P. Eyben, J. Mody, K. Paredis, L. Wouters, U. Celano, W. Vandervorst","doi":"10.1007/978-3-030-15612-1_3","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":377915,"journal":{"name":"Electrical Atomic Force Microscopy for Nanoelectronics","volume":"49 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Atomic Force Microscopy for Nanoelectronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-030-15612-1_3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}