{"title":"Wiener-Hammerstein System Estimator Initialisation Using a Random Multisine Excitation","authors":"P. Crama, J. Schoukens","doi":"10.1109/ARFTG.2001.327502","DOIUrl":null,"url":null,"abstract":"Wiener-Hammerstein systems consist of a linear dynamic system followed by a static nonlinearity, followed by another linear dynamic system. These models are difficult to identify due to the presence of two dynamic systems whose contributions to the system behaviour aren¿t easily separable. Usually, a nonlinear estimation procedure is used to estimate the parameters of the different parts. This nonlinear estimation procedure needs good starting values to converge quickly and/or reliably to a global minimum. This paper proposes a method to compute a first estimate based on one measurement record only.","PeriodicalId":331830,"journal":{"name":"58th ARFTG Conference Digest","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2001-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"58th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2001.327502","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
Wiener-Hammerstein systems consist of a linear dynamic system followed by a static nonlinearity, followed by another linear dynamic system. These models are difficult to identify due to the presence of two dynamic systems whose contributions to the system behaviour aren¿t easily separable. Usually, a nonlinear estimation procedure is used to estimate the parameters of the different parts. This nonlinear estimation procedure needs good starting values to converge quickly and/or reliably to a global minimum. This paper proposes a method to compute a first estimate based on one measurement record only.