Yiorgos I. Bontzios, M. Dimopoulos, A. Hatzopoulos
{"title":"A memetic algorithm for computing 3D capacitance in multiconductor VLSI circuits","authors":"Yiorgos I. Bontzios, M. Dimopoulos, A. Hatzopoulos","doi":"10.1109/DDECS.2011.5783108","DOIUrl":null,"url":null,"abstract":"A memetic algorithm for computing the capacitance coupling in Very Large Scale Integrated (VLSI) circuits is presented in this work. The method is based on an approximate extended version of the method of images, is general and applicable to an arbitrary geometry and configuration of conductors. Simulation results are presented for several practical case studies where our method is compared with a commercial tool employing the Finite Element Method (FEM). The capacitance value computed by the proposed method is shown to be in close agreement with the value obtained by the commercial tool with the average difference kept below 3%, thus revealing the efficiency of the proposed scheme.","PeriodicalId":231389,"journal":{"name":"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-04-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2011.5783108","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
A memetic algorithm for computing the capacitance coupling in Very Large Scale Integrated (VLSI) circuits is presented in this work. The method is based on an approximate extended version of the method of images, is general and applicable to an arbitrary geometry and configuration of conductors. Simulation results are presented for several practical case studies where our method is compared with a commercial tool employing the Finite Element Method (FEM). The capacitance value computed by the proposed method is shown to be in close agreement with the value obtained by the commercial tool with the average difference kept below 3%, thus revealing the efficiency of the proposed scheme.