Normally-off GaN switching 400V in 1.4ns using an ultra-low resistance and inductance gate drive

B. Hughes, R. Chu, J. Lazar, S. Hulsey, A. Garrido, D. Zehnder, Marcel Musni, K. Boutros
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引用次数: 18

Abstract

A turn-on time of 1.4ns is measured in a normally-off GaN synchronous boost converter switching 400V. The high-speed performance is achieved by significantly improving the GaN switches, packaging and gate drive. A recently developed normally-off, AlN-based insulating-gate, AlGaN/GaN-on-Si HFET operates with a high gate voltage of 6V [1]. The higher gate voltage increases gate current for faster switching. A Multi-Chip-Module (MCM) allows paralleling GaN switch up to 20Arms with low parasitic inductance of ~ 3.6nH in the power loop. The gate drive uses 50mΩ bare MOSFETs integrated onto the MCM to significantly reduce gate driver inductance to 1nH. The very fast switching results in large drain undershoot of 200V, and gate overshoot of more than 6V. Increasing the gate turn-on resistance to 1.4Ω eliminates gate voltage overshoot and reduces drain voltage overshoot to ~20V, at the cost of an increased turn-on time of 3ns.
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正常关断GaN开关400V在1.4ns使用超低电阻和电感栅极驱动
在正常关断的氮化镓同步升压变换器开关400V时,测量到1.4ns的导通时间。高速性能是通过显著改进GaN开关、封装和栅极驱动来实现的。AlGaN/GaN-on-Si HFET是最近开发的一种常关断的aln基绝缘栅,工作在6V的高栅电压下[1]。栅极电压越高,栅极电流越大,开关速度越快。多芯片模块(MCM)允许并行GaN开关高达20臂,在功率环路中寄生电感低至3.6nH。栅极驱动器使用50mΩ裸mosfet集成到MCM上,显著降低栅极驱动器电感至1nH。非常快速的开关导致200V的大漏极欠调和超过6V的栅极过调。将栅极导通电阻增加到1.4Ω可消除栅极电压过调,并将漏极电压过调降至~20V,但代价是导通时间增加3ns。
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