M. Cimino, H. Lapuyade, M. De matos, T. Taris, Y. Deval, J. Bégueret
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引用次数: 5
Abstract
A low noise amplifier designed in a 0.13 mum CMOS technology, which has self-test and high reliability capabilities, is presented. Such a LNA could be used in the design of front-end of critical nodes in wireless local area networks to ensure the data transmission. The test of the LNA is based on a built-in self test methodology that permits to monitor its behavior and its reliability is ensured by the use of redundancies. The LNA works under a 0.9 V supply voltage and the test chip has characteristics suitable for 802.11 b/g applications. Parametric faults are injected and detected that demonstrate the efficiency of the BIST circuitry. Switching on each redundant block has proven that the LNA keeps its performances.
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