Shape Dependency of Fatigue Life in Solder Joints of Chip Resistors

J. Ha, Chongyang Cai, Pengcheng Yin, Yangyang Lai, K. Pan, Junbo Yang, Seungbae Park
{"title":"Shape Dependency of Fatigue Life in Solder Joints of Chip Resistors","authors":"J. Ha, Chongyang Cai, Pengcheng Yin, Yangyang Lai, K. Pan, Junbo Yang, Seungbae Park","doi":"10.1109/ectc51906.2022.00237","DOIUrl":null,"url":null,"abstract":"This study is attempted to correlate between solder joint shape and fatigue life in experimental and numerical approaches. The test assemblies consisting of R1005 (1.0 × 0.5 mm) and R0402 (0.4 × 0.2 mm) soldered with SAC 305 solder material are subjected to thermal shock loading (-55 °C to 150 °C, dwell time 3 min, 6 cycles per hour). In an effort to analyze the effect of solder joint shape on fatigue life, the test assemblies are printed with different solder paste volume which induces variations in solder joint shape. The variations observed on the solder volumes generated are categorized as concave, straight, tiny convex, and convex symmetrically which are essentially achieved using stencils with different opening sizes. Another variation that is induced artificially is having unsymmetrical solder paste volume on two copper pads of a single component. Group of passive components which induces variations in solder joint shape symmetry or asymmetry are monitored to measure the resistances during thermal shock test.","PeriodicalId":139520,"journal":{"name":"2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2022-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ectc51906.2022.00237","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

Abstract

This study is attempted to correlate between solder joint shape and fatigue life in experimental and numerical approaches. The test assemblies consisting of R1005 (1.0 × 0.5 mm) and R0402 (0.4 × 0.2 mm) soldered with SAC 305 solder material are subjected to thermal shock loading (-55 °C to 150 °C, dwell time 3 min, 6 cycles per hour). In an effort to analyze the effect of solder joint shape on fatigue life, the test assemblies are printed with different solder paste volume which induces variations in solder joint shape. The variations observed on the solder volumes generated are categorized as concave, straight, tiny convex, and convex symmetrically which are essentially achieved using stencils with different opening sizes. Another variation that is induced artificially is having unsymmetrical solder paste volume on two copper pads of a single component. Group of passive components which induces variations in solder joint shape symmetry or asymmetry are monitored to measure the resistances during thermal shock test.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
片式电阻焊点疲劳寿命的形状依赖性
本研究试图通过实验和数值方法将焊点形状与疲劳寿命联系起来。测试组件由R1005 (1.0 × 0.5 mm)和R0402 (0.4 × 0.2 mm)与SAC 305焊料焊接组成,经受热冲击载荷(-55°C至150°C,停留时间3分钟,每小时6次循环)。为了分析焊点形状对疲劳寿命的影响,在测试组件上印制不同体积的锡膏,从而引起焊点形状的变化。在生成的焊料体积上观察到的变化被分类为凹、直、微凸和对称凸,这些基本上是使用不同开口尺寸的模板实现的。另一种人为诱导的变化是在单个组件的两个铜衬垫上具有不对称的锡膏体积。在热冲击试验中,对引起焊点形状对称或不对称变化的一组无源元件进行监测,以测量其电阻。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Transient Thermal Modeling of Die Bond Process in Multiple Die Stacked Flash Memory Package Development and Application of the Moisture-Dependent Viscoelastic Model of Polyimide in Hygro-Thermo-Mechanical Analysis of Fan-Out Interconnect Superb sinterability of the Cu paste consisting of bimodal size distribution Cu nanoparticles for low-temperature and pressureless sintering of large-area die attachment and the sintering mechanism Demonstration of Substrate Embedded Ni-Zn Ferrite Core Solenoid Inductors Using a Photosensitive Glass Substrate A De-Embedding and Embedding Procedure for High-Speed Channel Eye Diagram Oscilloscope Measurement
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1