Intelligent rapid investigation of S-Parameters (IRIS): Frequency & time domain channel analyzer

Nikita Ambasanal, Bhyrav Mutnuryz, Dipanjan Gopel
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Abstract

IRIS is a consolidated platform to analyse bulk S-Parameter data, perform operations like termination/renormalization of port impedances, conversion from single-ended to mixed mode, evaluate complex equations in S-Parameters, plug-in, View and record Violation of envelopes as defined by SATA, SAS, PCIe & USB spec sheets. It also implements a novel machine-learning based methodology [1] to efficiently bridge Frequency Domain (FD) and Time Domain (TD) by predicting Eye-Height (EH) and Eye-Widths (EW) from S-Parameters.
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s参数智能快速检测(IRIS):频时域信道分析仪
IRIS是一个综合平台,用于分析大量S-Parameter数据,执行端口阻抗的终止/重整化,从单端到混合模式的转换,评估S-Parameters中的复杂方程,插件,查看和记录SATA, SAS, PCIe和USB规格表定义的信封违规。它还实现了一种新的基于机器学习的方法[1],通过从s参数预测眼高(EH)和眼宽(EW),有效地桥接频域(FD)和时域(TD)。
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