A new path tracing algorithm with dynamic circuit extraction for sequential circuit fault diagnosis

Abstract

The authors propose a new diagnosis technique based on path tracing, which diagnoses fault locations in a sequential circuit by extracting combinational circuit blocks dynamically and tracing error propagation paths from failed primary outputs to fault origins. The dynamic circuit extraction reduces analysis area, which is suitable for a large circuit. By applying this technique to several ISCAS'89 benchmark circuits, the authors demonstrated that this technique could localize faults into 20 candidates within four hours.