Extraction of transient behavioral model of digital I/O buffers from IBIS

P. Tehrani, Yuzbe Chen, J. Fang
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引用次数: 21

Abstract

A method for extraction and simulation of transient behavioral models of state transition of digital I/O buffers is introduced. This scheme increases the speed of chip interconnect simulations with large number of simultaneous switching devices, while maintaining good accuracy compared to corresponding transistor level models. This paper covers the derivation procedures of such transient state transition behavioral models from IBIS modeling data. A comparison of simulation results between these models and transistor level models (SPICE models) is also included.
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IBIS数字I/O缓冲器瞬态行为模型的提取
介绍了一种数字I/O缓冲器状态转换瞬态行为模型的提取和仿真方法。该方案提高了具有大量同时开关器件的芯片互连模拟的速度,同时与相应的晶体管级模型相比,保持了良好的精度。本文介绍了基于IBIS建模数据的瞬态转换行为模型的推导过程。并将这些模型与晶体管级模型(SPICE模型)的仿真结果进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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