{"title":"ELDRS characterization up to 100 krad of texas instruments' dual amplifier LM158","authors":"B. Myers, K. Kruckmeyer, T. Trinh","doi":"10.1109/NSREC.2017.8115458","DOIUrl":null,"url":null,"abstract":"The ELDRS characterization data is presented for Texas Instruments' dual op amp LM158, where it is shown that results for the low dose rate have better performance than for the high dose rate. The LM158 is ELDRS free to 100 krad.","PeriodicalId":284506,"journal":{"name":"2017 IEEE Radiation Effects Data Workshop (REDW)","volume":"71 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSREC.2017.8115458","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
The ELDRS characterization data is presented for Texas Instruments' dual op amp LM158, where it is shown that results for the low dose rate have better performance than for the high dose rate. The LM158 is ELDRS free to 100 krad.
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