{"title":"Next generation lithography-implications","authors":"W. Trybula","doi":"10.1109/IEMT.1997.626943","DOIUrl":null,"url":null,"abstract":"The semiconductor industry growth continues to be driven to a large extent by steady advancements in microlithography. The SIA Roadmap renewal is underway and \"work-in-process\" predicts accelerating requirements. The 130 nm generation is anticipated to be needed in the year 2003, with the 100 nm generation 3 years later...the path to get there is not obvious! With a potential end to traditional optical lithography, the choices among Extreme Ultraviolet (EUV or soft X-ray), ion beam, projection e-beam, proximity X-ray, or alternative reflective technology is not obvious or guaranteed for success in the time required. The goal is to make a data-driven decision by late 1997. As the concluding paper in this special section on Lithography, this work will look at the implications of entering into a new technology as the industry attempts to maintain the historic growth curve-also called staying on the roadmap. The purpose of this paper is look at the issues and raise the questions that need to be considered before moving to a new technology.","PeriodicalId":227971,"journal":{"name":"Twenty First IEEE/CPMT International Electronics Manufacturing Technology Symposium Proceedings 1997 IEMT Symposium","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Twenty First IEEE/CPMT International Electronics Manufacturing Technology Symposium Proceedings 1997 IEMT Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1997.626943","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

The semiconductor industry growth continues to be driven to a large extent by steady advancements in microlithography. The SIA Roadmap renewal is underway and "work-in-process" predicts accelerating requirements. The 130 nm generation is anticipated to be needed in the year 2003, with the 100 nm generation 3 years later...the path to get there is not obvious! With a potential end to traditional optical lithography, the choices among Extreme Ultraviolet (EUV or soft X-ray), ion beam, projection e-beam, proximity X-ray, or alternative reflective technology is not obvious or guaranteed for success in the time required. The goal is to make a data-driven decision by late 1997. As the concluding paper in this special section on Lithography, this work will look at the implications of entering into a new technology as the industry attempts to maintain the historic growth curve-also called staying on the roadmap. The purpose of this paper is look at the issues and raise the questions that need to be considered before moving to a new technology.
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下一代光刻技术的启示
半导体行业的增长在很大程度上继续受到微光刻技术稳步发展的推动。SIA路线图更新正在进行中,“在制品”预测需求的加速。预计在2003年将需要130纳米一代,而100纳米一代将在3年后…通往那里的道路并不明显!随着传统光学光刻技术的潜在终结,在极紫外线(EUV或软x射线)、离子束、投影电子束、近距离x射线或替代反射技术之间的选择并不明显,也不能保证在所需的时间内取得成功。目标是在1997年年底之前作出数据驱动的决定。作为光刻技术特别部分的结束语,本文将探讨在行业试图保持历史增长曲线(也称为保持在路线图上)时,进入一项新技术的含义。本文的目的是研究问题,并提出在采用新技术之前需要考虑的问题。
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