Ka-Band GaN Large-Signal Model Considering Trap Effect on Nonlinear Capacitance by Using Transient S-Parameters Measurement

Y. Yamaguchi, Tomohiro Otsuka, M. Hangai, S. Shinjo, T. Oishi
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引用次数: 8

Abstract

In this paper, a Ka-band large-signal model in consideration of trap effect on non-linear capacitance was proposed. In this model, trap effect was modeled by using trap circuits including the diode, the resistance, and the capacitance. The trap circuit affects non-linear capacitance as well as drain current and transconductance. Moreover, to extract the model parameters in the trap circuit, transient s-parameters were measured. By using transient s-parameters measurement, trap effect on non-linear capacitance including trap time constant can be considered. As the result of verification of the model, the proposed model was in good agreement with the measured data of not only AM-AM but also AM-PM.
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基于瞬态s参数测量的考虑陷阱效应的ka波段GaN大信号模型
本文提出了一种考虑陷阱效应的ka波段大信号非线性电容模型。在这个模型中,利用陷阱电路包括二极管、电阻和电容来模拟陷阱效应。陷阱电路影响非线性电容以及漏极电流和跨导。此外,为了提取陷阱电路中的模型参数,测量了瞬态s参数。通过瞬态s参数测量,可以考虑陷阱对包括陷阱时间常数在内的非线性电容的影响。模型的验证结果表明,该模型不仅与AM-AM的实测数据吻合,而且与AM-PM的实测数据吻合良好。
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