Dislocations and defect structure around micro-indentations and Te precipitates in CdTe

V. Babentsov, F. Sizov, J. Franc, P. Fochuk, G. Yang, A. Bolotnikov, R. James
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Abstract

We investigated dislocation-related electronic states induced by dislocation motion in CdTe-based semiconductors. Dislocations cause various types of electronic defect states in the bandgap of semiconductors, namely, defects created by different types of dislocations, and those due to an impurity or native defect segregated around the dislocations. The aim of this work was to further clarify, on the basis of an analysis of the lattice deformation, whether these defects belong to either the Te or Cd sublattice and to formulate a model describing such defects.
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CdTe中微压痕和Te沉淀周围的位错和缺陷结构
我们研究了cdte基半导体中位错运动引起的位错相关电子态。位错在半导体带隙中引起各种类型的电子缺陷态,即由不同类型的位错产生的缺陷,以及由位错周围分离的杂质或天然缺陷引起的缺陷。这项工作的目的是在分析晶格变形的基础上进一步澄清这些缺陷是否属于Te或Cd亚晶格,并制定描述此类缺陷的模型。
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