All-pass SC biquad reconfiguration scheme for oscillation based analog BIST

Abstract

In this work, a test reconfiguration scheme for switched-capacitor stages featuring biquadratic transfer functions with finite complex zeros is presented. The proposed approach allows to perform the oscillation-based test of relevant biquad parameters without the need for complex stimulus generation or analog output processing and requires low analog area overhead. The scheme is especially suitable for implementing low-cost analog BIST of SC filter cores embedded within complex mixed-signal devices.