{"title":"Challenges of Replacing Legacy Analog Instrumentation During TPS Rehost Projects","authors":"Y. Eracar, Thomas Jacobs","doi":"10.1109/AUTEST.2018.8532542","DOIUrl":null,"url":null,"abstract":"This paper starts with a brief overview of Test Program Set (TPS) life cycle and explains TPS maintenance (and/or re-host) issues that come with long-term support requirements. The focus of the paper is the compatibility issues found between the legacy and the replacement analog instrumentation during two recent TPS re-host projects. A detailed analysis is provided for the compatibility issues and the applied solutions from the perspective of both the TPS developer and the analog instrument vendor. The paper is concluded with a section on possible approaches to design a new analog instrument that needs to replace a legacy instrument without sacrificing from the features necessary for modern test requirements.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"124 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2018.8532542","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper starts with a brief overview of Test Program Set (TPS) life cycle and explains TPS maintenance (and/or re-host) issues that come with long-term support requirements. The focus of the paper is the compatibility issues found between the legacy and the replacement analog instrumentation during two recent TPS re-host projects. A detailed analysis is provided for the compatibility issues and the applied solutions from the perspective of both the TPS developer and the analog instrument vendor. The paper is concluded with a section on possible approaches to design a new analog instrument that needs to replace a legacy instrument without sacrificing from the features necessary for modern test requirements.
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