The SIMEST: a new EST structure without parasitic thyristor achieved using SIMOX technology

S. Sridhar, B. J. Baliga
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引用次数: 2

Abstract

A new EST structure, in which the lateral N-channel MOSFET is isolated from the thyristor by using SIMOX technology to eliminate the parasitic thyristor, is presented. This structure exhibits high voltage current saturation beyond the breakdown voltage of the lateral N-channel MOSFET. It is shown with the aid of two-dimensional numerical simulations that the proposed SIMEST has a lower on-state voltage drop than the conventional EST and the IGBT, and an FBSOA comparable to that of an IGBT with identical design rules. Experimental results on the SIMEST fabricated with a 9 mask SIMOX Smart Power process are presented.
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SIMEST:采用SIMOX技术实现的无寄生晶闸管的新型EST结构
提出了一种新的EST结构,该结构采用SIMOX技术将横向n沟道MOSFET与晶闸管隔离,以消除寄生晶闸管。这种结构表现出超过横向n沟道MOSFET击穿电压的高电压电流饱和。二维数值模拟结果表明,该方法具有比传统EST和IGBT更低的导通压降,在相同设计规则下,其FBSOA可与IGBT相比较。介绍了用9掩模SIMOX智能电源工艺制备SIMEST的实验结果。
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