{"title":"High-speed performance of Silicon Bridge die-to-die interconnects","authors":"H. Braunisch, A. Aleksov, S. Lotz, J. Swan","doi":"10.1109/EPEPS.2011.6100196","DOIUrl":null,"url":null,"abstract":"Silicon Bridge is a dense multichip packaging architecture that enables high die-to-die interconnect density and corresponding applications. We describe the basic ideas of the concept, discuss density in the die-to-die interconnect context, and report results of electrical high-speed performance simulations, based on both two-dimensional and three-dimensional electromagnetic modeling.","PeriodicalId":313560,"journal":{"name":"2011 IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"23","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2011.6100196","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 23
Abstract
Silicon Bridge is a dense multichip packaging architecture that enables high die-to-die interconnect density and corresponding applications. We describe the basic ideas of the concept, discuss density in the die-to-die interconnect context, and report results of electrical high-speed performance simulations, based on both two-dimensional and three-dimensional electromagnetic modeling.