"Recovery Characteristics of Ionic Drift Induced Failures under Time/Temperature Stress"

J. J. Bell
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引用次数: 1

Abstract

A model has been presented by Hofstein which characterizes drift of free sodium ions through silicon dioxide under positive and negative bias. This investigation examines the model to determine if it is applicable to drift recovery under zero bias conditions. A modified model is presented for the time/temperature relationship of unbiased drift recovery.
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时间/温度应力下离子漂移诱导失效的恢复特性
霍夫斯坦提出了一个模型,描述了自由钠离子在正偏压和负偏压下通过二氧化硅的漂移。本研究检验了该模型,以确定它是否适用于零偏条件下的漂移恢复。提出了一种修正的无偏漂移恢复时间/温度关系模型。
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