Synthesis of Efficient Linear Test Pattern Generators

Avijit Dutta, N. Touba
{"title":"Synthesis of Efficient Linear Test Pattern Generators","authors":"Avijit Dutta, N. Touba","doi":"10.1109/DFT.2006.61","DOIUrl":null,"url":null,"abstract":"This paper presents a procedure for synthesis of linear test pattern generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area, speed, internal fan out, and randomness properties and outperform existing linear test pattern generator designs including linear feedback shift registers (LFSRs) and cellular automatons (CAs). SLING is a constraint-driven synthesis procedure that takes as input a set of constraints and then synthesizes a test pattern generator that satisfies those constraints. SLING uses a set of linear transformations that it applies iteratively to evolve a linear test pattern generator. Because of the way the transformations are chosen and constraints are set, a high degree of phase shift is maintained between every pair of linear sequences generated at different bit positions of the generator and cross and auto correlations are highly minimized. Hardware overhead in terms of XOR gates is also minimized. Comparative analysis and experimental results show the effectiveness of the proposed synthesis scheme","PeriodicalId":113870,"journal":{"name":"2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT.2006.61","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

This paper presents a procedure for synthesis of linear test pattern generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area, speed, internal fan out, and randomness properties and outperform existing linear test pattern generator designs including linear feedback shift registers (LFSRs) and cellular automatons (CAs). SLING is a constraint-driven synthesis procedure that takes as input a set of constraints and then synthesizes a test pattern generator that satisfies those constraints. SLING uses a set of linear transformations that it applies iteratively to evolve a linear test pattern generator. Because of the way the transformations are chosen and constraints are set, a high degree of phase shift is maintained between every pair of linear sequences generated at different bit positions of the generator and cross and auto correlations are highly minimized. Hardware overhead in terms of XOR gates is also minimized. Comparative analysis and experimental results show the effectiveness of the proposed synthesis scheme
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
高效线性测试图发生器的合成
本文介绍了一种称为SLING的线性测试图发生器的合成方法。SLING可以合成满足面积、速度、内部扇出和随机性约束的线性测试图发生器,并且优于现有的线性测试图发生器设计,包括线性反馈移位寄存器(LFSRs)和元胞自动机(ca)。SLING是一个约束驱动的合成过程,它将一组约束作为输入,然后合成一个满足这些约束的测试模式生成器。SLING使用一组线性转换,它迭代地应用这些转换来发展线性测试模式生成器。由于选择变换和设置约束的方式,在发生器的不同位位置生成的每对线性序列之间保持了高度的相移,并且交叉和自相关被高度最小化。异或门方面的硬件开销也被最小化。对比分析和实验结果表明了所提出的综合方案的有效性
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Employing On-Chip Jitter Test Circuit for Phase Locked Loop Self-Calibration Timing Failure Analysis of Commercial CPUs Under Operating Stress A Built-In Redundancy-Analysis Scheme for Self-Repairable RAMs with Two-Level Redundancy Effect of Process Variation on the Performance of Phase Frequency Detector Self Testing SoC with Reduced Memory Requirements and Minimized Hardware Overhead
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1