The formation of sub-micro partial SOI materials by SIMOX technology

Jiayin Sun, Jing Chen, Meng Chen, Xi Wang
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引用次数: 2

Abstract

In this paper, we try to fabricate sub-micro windows in BOX layer. The pattern thermal oxide layer we used for mask implantation was shown. The typical widths of thermal oxide strips are 150nm and /spl sim/75nm and the space of each strips is 1/spl mu/m. The O/sup +/ ions are implanted through the patterned masking oxide. The XTEM images of the SOI structures are shown. The widths of BOX windows are 236nm (left) and 150 nm (right). It is very interesting that the windows are about 75 nm wider than the corresponding masking strips.
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SIMOX技术制备亚微偏SOI材料
在本文中,我们尝试在BOX层中制作亚微窗口。图中显示了我们用于掩模植入的热氧化层图案。热氧化条的典型宽度为150nm和/spl sim/75nm,每条条的间距为1/spl mu/m。O/sup +/离子通过图案掩蔽氧化物注入。给出了SOI结构的XTEM图像。BOX窗口的宽度为236nm(左)和150nm(右)。非常有趣的是,窗口比相应的掩蔽条宽约75 nm。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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