C. Weulersse, M. Mazurek, S. Morand, C. Binois, O. Crépel
{"title":"Neutron sensitivity of high voltage SiC devices for avionics applications","authors":"C. Weulersse, M. Mazurek, S. Morand, C. Binois, O. Crépel","doi":"10.1109/RADECS50773.2020.9857698","DOIUrl":null,"url":null,"abstract":"The SEE radiation tolerance of power SiC devices from several manufacturers has been studied. Safe Operating Areas, as well as failure rates at aircraft altitudes, have been characterized through testing at ChipIr facility, in order to validate the common used derating value of 50%.","PeriodicalId":371838,"journal":{"name":"2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"82 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS50773.2020.9857698","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The SEE radiation tolerance of power SiC devices from several manufacturers has been studied. Safe Operating Areas, as well as failure rates at aircraft altitudes, have been characterized through testing at ChipIr facility, in order to validate the common used derating value of 50%.
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