Shine C. Chung, Wen-Kuan Fang, Y. Hsu, J. Hsiao, L. Lin, Wen-Hua Yu
{"title":"Ultra-small and ultra-reliable innovative fuses scalable from 0.35um to 28nm","authors":"Shine C. Chung, Wen-Kuan Fang, Y. Hsu, J. Hsiao, L. Lin, Wen-Hua Yu","doi":"10.1109/ICMTS.2016.7476195","DOIUrl":null,"url":null,"abstract":"I-fuse is a fuse-based technology having (a) 1R1D cell, (b) limited programming below a critical current, and (c) small cell to improve program efficiency to pass qualification at 300°C for 4,290 hours. Test structures consist of single 1R1D structure and mini-arrays are used to characterize (a) critical current, (b) diode characteristics, and (c) cell current distribution.","PeriodicalId":344487,"journal":{"name":"2016 International Conference on Microelectronic Test Structures (ICMTS)","volume":"128 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 International Conference on Microelectronic Test Structures (ICMTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMTS.2016.7476195","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
I-fuse is a fuse-based technology having (a) 1R1D cell, (b) limited programming below a critical current, and (c) small cell to improve program efficiency to pass qualification at 300°C for 4,290 hours. Test structures consist of single 1R1D structure and mini-arrays are used to characterize (a) critical current, (b) diode characteristics, and (c) cell current distribution.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
