A Hash based Secure Scheme (HSS) against scanbased attacks on AES cipher

J. Popat, U. Mehta, M. Upadhyay
{"title":"A Hash based Secure Scheme (HSS) against scanbased attacks on AES cipher","authors":"J. Popat, U. Mehta, M. Upadhyay","doi":"10.1109/ITCIndia49857.2020.9171790","DOIUrl":null,"url":null,"abstract":"The AES is used in portable devices for secure communication. The AES is incorporated with scan-chains to make it testable. However, it poses security vulnerability since AES cipher can be attacked to recover private key. We propose a novel countermeasure, Hash based secure scheme, to prevent such attack.","PeriodicalId":346727,"journal":{"name":"2020 IEEE International Test Conference India","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE International Test Conference India","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ITCIndia49857.2020.9171790","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The AES is used in portable devices for secure communication. The AES is incorporated with scan-chains to make it testable. However, it poses security vulnerability since AES cipher can be attacked to recover private key. We propose a novel countermeasure, Hash based secure scheme, to prevent such attack.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
针对AES密码扫描攻击的基于哈希的安全方案(HSS)
AES用于便携式设备的安全通信。AES与扫描链相结合,使其可测试。但是,由于AES密码可以被攻击以恢复私钥,因此存在安全漏洞。我们提出了一种新的对策,基于哈希的安全方案,以防止这种攻击。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
A non-ICL UVM approach to verifying DFx IJTAG network and its pros and cons v/s the ICL-PDL approach Machine Learning based Temperature Estimation for Test Scheduling of 3D ICs Built-In Self-Repair for Manufacturing and Runtime TSV Defects in 3D ICs ITC India 2020 Author Index Wavelet Transform based fault diagnosis in analog circuits with SVM classifier
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1