Single Event Effects Characterization Using a Single Photon Absorption Laser

Abstract

The use of a pulsed laser to analyze a circuit's susceptibility to radiation-induced errors has been a topic of interest to the radiation effects community. Research has shown that while lasers inject charge differently compared to radiation, the errors observed match closely. Los Alamos National Laboratories (LANL) has procured a single photon absorption pulsed laser system designed for radiation effects testing. It is currently unknown how the system correlates to other test facilities. In this paper we present a comparison between results obtained at LANL to existing published results. We also show that, for our system, there is only a small difference between topside and backside laser testing.